Detection of Transient Spectra within Polycrystalline Samples Using the New Technique of Diffuse Reflectance Flash Photolysis

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Abstract:

A powdered semiconductor (ZnO) and a polycrystalline sample of perovskite-type LaAlO3 doped with 1% Cr(III) have been subjected to the recently developed technique of diffuse reflectance flash photolysis. In both cases transient absorption spectra are obtained from these powdered, nontransparent samples and these are reported here. Thus, the method allows the direct observation of absorption by transient species formed following pulsed irradiation within powdered samples as well as from highly scattering interfaces demonstrating that the technique has high potential for investigating heterogeneous photochemical systems.

Keywords: Flash photolysis; Powders; Reflectance; Semiconductor; Transients

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702824639213

Affiliations: 1: Institute fur Physikalische und Theoretische Chemie der Universitat, D-7400, Tubingen, West Germany 2: Department of Chemistry, University of Technology, Loughborough, Leicestershire, LE11 3TU, England

Publication date: November 1, 1982

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