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Instrumental Distortions of Raman Lines

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Abstract:

The effect of spectrometer resolution on the peak intensity and the full width at half maximum (FWHM) of a Lorentzian spectrum is obtained by evaluating the convoluted line shapes. Spectrometer resolution functions (SRF) having Gaussian and triangular profiles are considered separately. Empirical relations to estimate the true peak intensity and the FWHM from the observed parameters are suggested. These relations are valid over an extended range of parameters with an accuracy better than that of other methods suggested earlier. As an application, the true FWHM's and peak intensities of the main component of the Raman active Ag mode of sulphate ion in potash alum at low temperatures are evaluated.

Keywords: Estimation of true parameters; Linewidths; Peak intensity; Raman spectroscopy; Spectrometer resolution

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702824639682

Affiliations: Materials Science Laboratory, Reactor Research Centre, Kalpakkam 603 102, Tamil Nadu, India

Publication date: July 1, 1982

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