Layered Synthetic Microstructures as Dispersing Devices in X-ray Spectrometers

Authors: Gilfrich, J. V.1; Nagel, D. J.1; Barbee, T. W.2

Source: Applied Spectroscopy, Volume 36, Issue 1, Pages 1-76 (January/February 1982) , pp. 58-61(4)

Publisher: Society for Applied Spectroscopy

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Abstract:

Layered synthetic microstructures (LSM's) are useful dispersing devices for x-ray spectroscopy. They can be produced with virtually any layer spacing (d) greater than approximately 10 Å and they have high diffraction efficiency. Integral reflection coefficients for such structures made up of alternating layers of a transition metal and carbon are 3 to 10 times greater than values for other dispersing elements used in the moderate to long wavelength region of the x-ray spectrum. Resolving power of the LSMs is somewhat poorer than crystals at this time but is sufficient to permit significant applications.

Keywords: Layered synthetic microstructures; X-ray dispersing elements; X-ray spectrometers

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702824639024

Affiliations: 1: Naval Research Laboratory, Washington, DC 20375 2: Materials Science and Engineering Department, Stanford University, Stanford, California 94305

Publication date: January 1, 1982

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