Layered Synthetic Microstructures as Dispersing Devices in X-ray Spectrometers

Authors: Gilfrich, J. V.1; Nagel, D. J.1; Barbee, T. W.2

Source: Applied Spectroscopy, Volume 36, Issue 1, Pages 1-76 (January/February 1982) , pp. 58-61(4)

Publisher: Society for Applied Spectroscopy

Buy & download fulltext article:


Price: $29.00 plus tax (Refund Policy)


Layered synthetic microstructures (LSM's) are useful dispersing devices for x-ray spectroscopy. They can be produced with virtually any layer spacing (d) greater than approximately 10 Å and they have high diffraction efficiency. Integral reflection coefficients for such structures made up of alternating layers of a transition metal and carbon are 3 to 10 times greater than values for other dispersing elements used in the moderate to long wavelength region of the x-ray spectrum. Resolving power of the LSMs is somewhat poorer than crystals at this time but is sufficient to permit significant applications.

Keywords: Layered synthetic microstructures; X-ray dispersing elements; X-ray spectrometers

Document Type: Research Article


Affiliations: 1: Naval Research Laboratory, Washington, DC 20375 2: Materials Science and Engineering Department, Stanford University, Stanford, California 94305

Publication date: January 1, 1982

More about this publication?
Related content



Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page