Total Internal Reflection Raman Spectroscopy at the Critical Angle for Raman Measurements of Thin Films
Abstract:Total internal reflection Raman spectroscopy at the critical angle has been shown to be useful for Raman measurements of not only thin films but also of any samples that can be directly coated or intimately contacted on the internal reflection element (IRE). Usefulness of this technique was demonstrated for a polystyrene film (0.70 μm thick) coated on the IRE, signal enhancement being 40 as compared with the conventional normal illumination. The technique was also applied to a thin coating layer of bovine albumin on the IRE to give the spectrum of excellent signal/noise ratio.
Document Type: Research Article
Affiliations: Government Industrial Research Institute, Osaka, Midorigaoka 1, Ikeda, Osaka, Japan 563
Publication date: November 1, 1981
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