Applied Spectroscopy

Survey of Computer Aided Methods for Mass Spectral Interpretation
pp. 255-266(12)
Author: Martinsen, David P.

Measurement of Solvent Shifts by Raman Difference Spectroscopy
pp. 267-271(5)
Authors: Laane, Jaan; Kiefer, Wolfgang

Fourier Self-Deconvolution: A Method for Resolving Intrinsically Overlapped Bands
pp. 271-276(6)
Authors: Kauppinen, Jyrki K.; Moffatt, Douglas J.; Mantsch, Henry H.; Cameron, David G.

Closed-Form Calculation of Coherent Anti-Stokes Raman and Stimulated Raman Scattering Spectral Profiles
pp. 276-278(3)
Authors: Perkins, P.E.; Lewis, J.W.L.

Infrared Rotatory Dispersion of Induced Cholesteric Phases Measured with a Fourier Transform Spectrophotometer
pp. 279-280(2)
Authors: Belz, H.H.; Jede, F.; Schrader, B.

Applications of the Optical Multichannel Analyzer for Low Light Level Signal Averaging and Two-Dimensional Mode Detection of Picosecond Laser-Generated Raman Spectra
pp. 281-289(9)
Author: Chao, J.L.

Vibrational Manifold Considerations for the Metal Indicator Dye 2-(2-Pyridylazo)-1-Naphthol
pp. 289-292(4)
Authors: Long, M.E.; Trotter, P.J.

A Critical Comparison of Ar and Ar-N₂ Inductively Coupled Plasmas as Excitation Sources for Atomic Emission Spectrometry
pp. 292-302(11)
Authors: Montaser, Akbar; Fassel, V.A.; Zalewski, J.

The Use of a High Temperature Hollow Cathode Lamp for the Determination of Trace Elements in Steels, Nickel-Base Alloys, and Ferroalloys by Emission Spectrometry
pp. 302-307(6)
Author: Thelin, Bo

Fabrication and Utilization of a High-power Microwave Supply for Electrodeless Discharge Lamps and Other Spectrochemical Emission Sources
pp. 308-311(4)
Authors: Goode, Scott R.; Baughman, Kim W.; Pipes, Dennis T.; Sandridge, Michael R.

Ionization of Group II A Elements in the Direct Current Plasma: Effects of Ionization Potential on Emission Profiles
pp. 312-317(6)
Authors: Williams, Ronald R.; Coleman, Geoffrey N.

Experimental and Theoretical Comparison of the Precision of Flame Atomic Absorption, Fluorescence, and Emission Measurements
pp. 317-324(8)
Authors: Bower, N.W.; Ingle, J.D.

Preparation of Standards for Thin Film Thickness Measurements by Energy Dispersive X-ray Analysis
pp. 324-328(5)
Author: Kammlott, G.W.

EPR Study of Homogentisate Oxygenase from Aspergillus Sp.
pp. 328-331(4)
Authors: Sonoda, Masaru; Sakagishi, Yoshikatsu

A Method for Extending or Repairing Inductively Coupled Plasma (ICP) Torches
pp. 332-334(3)
Authors: Devine, Daniel J.; Brown, Robert M.; Fry, Robert C.