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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.

Previously published as Bulletin (Society for Applied Spectroscopy)

Applied Spectroscopy was previously published as Bulletin (Society for Applied Spectroscopy).

Publisher: Society for Applied Spectroscopy

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Volume 34, Issue 6, Pages 615-704 (November/December 1980)

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Analysis of Mixtures of Coal-derived Phenols by 19F NMR of Hexafluoroacetone Adducts
pp. 615-617(3)
Authors: Bartle, Keith D.; Matthews, Raymond S.; Stadelhofer, Jürgen W.

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Electronic Raman Spectroscopy of Rare Earth Doped Yttrium Aluminum Garnet Layers Grown by Liquid Phase Epitaxy
pp. 622-624(3)
Authors: van den Boom, H.; Breemer, R. E.; Robertson, J. M.

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An X-ray Photoelectron (ESCA) and Laser Raman Spectroscopic Investigation of Aluminum Perrhenate
pp. 624-626(3)
Authors: Salvati, Lawrence; Jones, Gerald L.; Hercules, David M.

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Raman Studies of the Adduct Structure of Cl2 and Br2 with Piaselenole
pp. 636-638(3)
Authors: Blaha, J. J.; Brittain, W.; Meloan, C. E.; Fateley, W. G.

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The Measurement of the Optical Constants of Thin Solid Films in the Infrared
pp. 638-645(8)
Authors: Ribbegård, G. K.; Jones, R. N.

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A Reflection Spectrophotometer for the Measurement of the Optical Constants of Liquids in the Infrared
pp. 646-651(6)
Authors: Cameron, D. G.; Escolar, D.; Goplen, T. G.; Nadeau, A.; Young, R. P.; Jones, R. N.

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Absolute Absorption Intensity and Dispersion Measurements on Some Organic Liquids in the Infrared
pp. 657-691(35)
Authors: Goplen, T. G.; Cameron, D. G.; Jones, R. N.

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Interferences in Sputter-Atomization Atomic Absorption Spectroscopy
pp. 692-695(4)
Authors: McCamey, D. A.; Niemczyk, T. M.

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Tape of Teflon Fluorocarbon Resin as an Infrared Window Material
pp. 702-704(3)
Author: Lephardt, John O.

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