A technique of using second derivative spectra has been developed by which accurate infrared line widths and shapes may be measured using a single-beam tunable diode laser spectrometer both for a flat background and in the presence of a sloping background. It is shown that there exist
easily measured parameters of the second derivative line profile which are independent of a small linearly sloping background. A procedure was developed which uses sets of precomputed model line profiles to allow an estimate of the true linewidth of a line to be derived from the second derivative
spectrum. The accuracy of this technique is limited by the accuracy with which the second derivative line profile can be measured.
Department of Chemistry, Ohio University, Athens, Ohio 45701
Publication date: January 1, 1980
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