Skip to main content

Second Derivative Tunable Diode Laser Spectrometry for Line Profile Determination I. Theory

Buy Article:

$29.00 plus tax (Refund Policy)


A technique of using second derivative spectra has been developed by which accurate infrared line widths and shapes may be measured using a single-beam tunable diode laser spectrometer both for a flat background and in the presence of a sloping background. It is shown that there exist easily measured parameters of the second derivative line profile which are independent of a small linearly sloping background. A procedure was developed which uses sets of precomputed model line profiles to allow an estimate of the true linewidth of a line to be derived from the second derivative spectrum. The accuracy of this technique is limited by the accuracy with which the second derivative line profile can be measured.

Keywords: Infrared; Lasers, tunable diode; Second derivative spectrometry; Techniques, spectroscopic

Document Type: Research Article


Affiliations: Department of Chemistry, Ohio University, Athens, Ohio 45701

Publication date: January 1, 1980

More about this publication?

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more