Second Derivative Tunable Diode Laser Spectrometry for Line Profile Determination I. Theory

Authors: Olson, Mark L.; Grieble, David L.; Griffiths, Peter R.

Source: Applied Spectroscopy, Volume 34, Issue 1, Pages 1-97 (January/February 1980) , pp. 50-56(7)

Publisher: Society for Applied Spectroscopy

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Abstract:

A technique of using second derivative spectra has been developed by which accurate infrared line widths and shapes may be measured using a single-beam tunable diode laser spectrometer both for a flat background and in the presence of a sloping background. It is shown that there exist easily measured parameters of the second derivative line profile which are independent of a small linearly sloping background. A procedure was developed which uses sets of precomputed model line profiles to allow an estimate of the true linewidth of a line to be derived from the second derivative spectrum. The accuracy of this technique is limited by the accuracy with which the second derivative line profile can be measured.

Keywords: Infrared; Lasers, tunable diode; Second derivative spectrometry; Techniques, spectroscopic

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702804731014

Affiliations: Department of Chemistry, Ohio University, Athens, Ohio 45701

Publication date: January 1, 1980

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