Rapid Method for the Measurement of Monochromator Parameters in the Near Infrared

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Abstract:

This paper describes a technique used for measuring monochromator characteristics in the near IR. It is shown that with an interferometer spectrophotometer, one can obtain parameters such as stray light, efficiency, resolution, bandwidth, and accuracy of wavelength readout. The advantage of this technique is simplicity and speed in data gathering.

Keywords: Infrared; Interferometry, Fourier transform; Monochromator

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702794925994

Affiliations: Neotec Electronics, Inc., 2431 Linden Lane, Silver Springs, Maryland 20910 and Instrumentation Research Laboratory, Science and Education Administration, Federal Research, U.S. Department of Agriculture, Beltsville, Maryland 20705

Publication date: March 1, 1979

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