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The Quantitative Determination of Surface Oxide and Interfacial Metal Lost in Erbium Tritide Films

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Abstract:

Thin film technology is important in many disciplines. A common problem encountered is the resulting purity of the deposited film. A contribution to this contamination is the interactions between the metal film and the substrates. Our particular interest is in erbium deuteride/tritide thin films, which are used for neutron generator targets.

Keywords: Erbium; Hydrogen storage; Isotopes; Rare earth; Rare earth hydride; Thin films

Document Type: Short Communication

DOI: http://dx.doi.org/10.1366/000370278774331701

Affiliations: 1: General Electric Company, Neutron Devices Department, P. O. Box 11508, St. Petersburg, Florida 33733 2: Department of Chemistry, University of South Florida, Tampa, Florida 33620

Publication date: January 1, 1978

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