Infrared Intensity Measurements by Band Contour Analysis

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Abstract:

A spectroscopic band profile that can be used for asymmetric as well as for symmetric bands is proposed. The meaning of the asymmetry parameter is discussed, and the applications of this profile in infrared intensity determinations are examined.

Keywords: Band analysis; Infrared spectroscopy; Intensity determinations

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370278774331800

Affiliations: 1: Department of Chemistry, University of Rhode Island, Kingston, Rhode Island 02881; present address: Laboratorium voor Anorganische Scheikunde, Rijksuniversitair Centrum Antwerpen, Groenenborgerlaan, 171, B2020 Antwerp, Belgium 2: Department of Chemistry, University of Rhode Island, Kingston, Rhode Island 02881 3: Laboratorium voor Anorganische Scheikunde, Rijksuniversitair Centrum Antwerpen, Groenenborgerlaan, 171, B2020 Antwerp (Belgium)

Publication date: January 1, 1978

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