The Use of Some Metal Photocathodes for Absolute Intensity Measurements in the Soft X-ray-Vacuum Ultraviolet

Authors: Burns, Erskine J.T.¹; Thurston, John F.²

Source: Applied Spectroscopy, Volume 31, Issue 4, Pages 253-339 (July/August 1977) , pp. 317-320(4)

Publisher: Society for Applied Spectroscopy

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Abstract:

The total electron emission of better than 99.9% bulk purity aluminum, titanium, iron, and copper has been measured for six photon energies impinging at near normal incidence (90 ± 0.8°) to the electron emitting surface. Six nearly monochromatic photon energies between 0.109 and 1.49 keV were used. Surface smoothness, oxygen, and carbon contaminants were found to strongly influence the electron emission from these devices.

Keywords: X-ray detectors; Photoelectric yields; Instrumentation-emission spectroscopy; Time-resolved spectroscopy

Document Type: Research article

DOI: http://dx.doi.org/10.1366/000370277774463535

Affiliations: 1: Air Force Weapons Laboratory, Kirtland AFB, New Mexico 87117; present address: Division 5242, Sandia Laboratories, Albuquerque, NM 87115 2: Air Force Weapons Laboratory, Kirtland AFB, New Mexico 87117

Publication date: 1977-07-01

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