The Measurement of a ~60000:1 rms Signal/Noise Ratio in Fourier Transform Infrared Spectroscopy
Authors: Foskett, C.; Hirschfeld, T.
Source: Applied Spectroscopy, Volume 31, Issue 3, Pages 187-247 (May/June 1977) , pp. 239-241(3)
Publisher: Society for Applied Spectroscopy
Abstract:
There has been considerable discussion about the signal/noise ratios attainable in Fourier transform infrared (FT-ir) spectroscopy. This involves not only the magnitude of the multiplex and throughput advantages of FT-ir, but also several other features of this technology.Keywords: FT-ir spectroscopy; Instrumentation, infrared; techniques, spectroscopic
Document Type: Short communication
DOI: http://dx.doi.org/10.1366/000370277774463724
Affiliations: 1: Digilab, Cambridge, Massachusetts 02139 and Block Engineering, Inc., Cambridge, Massachusetts 02139
Publication date: 1977-05-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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