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The Thickness Effect in X-ray Absorption Edges of Metals and Alloys

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The thickness effect is treated using a simplified form for the window function and the absorption edge. It is shown that for the low absorbing portion of the K edge the relative error caused by the tail of the window function becomes larger, rather than vanishing, in the limit of zero thickness foils. A means is described and experimentally demonstrated for separating changes in K absorption edge fine structure due to alloying from those due to the thickness effect.

Keywords: Absorption; Alloys; Techniques, spectroscopic; X-ray

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370276774457056

Affiliations: Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06268

Publication date: July 1, 1976

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