Wavelength Modulation for Background Correction in Graphite Furnace Atomic Emission Spectrometry

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The use of wavelength modulation for background correction in graphite furnace atomic emission spectrometry is shown to improve detection limits in some cases by several orders of magnitude and to increase its applicability to sample analysis. An HGA-2100 graphite furnace atomizer is used in conjunction with a ¾-m monochromator equipped for wavelength modulation. A discussion of analytical growth curves, detection limits, scatter, and optimization of signal/noise ratio is presented. Copper is analyzed in botanical samples and the results are compared to analysis by atomic absorption and molecular absorption spectrophotometry.

Keywords: Graphite furnace atomic emission spectrometry; Repetitive wavelength scanning, Wavelength modulation

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370276774457263

Affiliations: 1: Institute for Materials Research, Analytical Chemistry Division, National Bureau of Standards, Washington, D. C. 20234 2: Department of Chemistry, University of Maryland, College Park, Maryland 20742

Publication date: May 1, 1976

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