If you are experiencing problems downloading PDF or HTML fulltext, our helpdesk recommend clearing your browser cache and trying again. If you need help in clearing your cache, please click here . Still need help? Email help@ingentaconnect.com

Electron Microbeam Probe Diagnostics on Ion Scattering Craters

$29.00 plus tax (Refund Policy)

Buy Article:

Abstract:

Surface analysis techniques such as ion scattering spectroscopy (ISS) and secondary ion mass spectroscopy (SIMS) use a beam of inert ions of approximately 0.5 to 3.0 ke V energy to slowly sputter away the surface of a solid material. The energy of the scattered ion is then measured (ISS) or the mass spectrum is recorded for the sputtered ionic species (SIMS) to provide an elemental profile analysis.

Keywords: Craters; Ion scattering spectroscopy; Microprobe; Secondary ion mass spectroscopy; Surfaces

Document Type: Short Communication

DOI: http://dx.doi.org/10.1366/000370276774456309

Affiliations: Air Force Materials Laboratory (MBM), Wright-Patterson AFB, Ohio 45433

Publication date: March 1, 1976

More about this publication?
Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more