Integral Reflection Coefficient of X-ray Spectrometer Crystals
Abstract:Analyzing crystals used in x-ray spectrometers have widely varying diffraction efficiencies. When employed in x-ray fluorescence analysis, the parameter which defines the efficiency is the integral reflection coefficient. This parameter has been measured using a single crystal spectrometer, as a function of wavelength, for a number of crystals commonly used. A recent adaptation of an existing diffraction theory is shown to make possible the calculation of integral reflection coefficients which agree with measured values.
Document Type: Research Article
Affiliations: Naval Research Laboratory, Washington, D.C. 20375
Publication date: July 1, 1975
More about this publication?
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
- Editorial Board
- Information for Authors
- Submit a Paper
- Subscribe to this Title
- Membership Information
- Request copyrighted SAS materials
- Spectroscopic Nomenclature
- Focal Point (Open Access)
- ingentaconnect is not responsible for the content or availability of external websites