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The Determination of Parts per Million Levels of Thorium in Optical Components by X-ray Fluorescence

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Abstract:

A nondestructive technique for the determination of thorium in optical glass has been devised using tube-excited x-ray fluorescence with an energy-dispersive detector. Capability for full calibration and sample analysis has been incorporated into a computer-coupled system. Bulk thorium concentrations as low as 87 ppm have been detected with a coefficient of variation of 27.2% at 95% confidence using NBS-certified standards. At 466 ppm the coefficient of variation was 5.6% at the 95% confidence level. Qualitative determination of thorium in optical coatings has been demonstrated also.

Keywords: Analysis, for thorium; Computer applications; Crystal, glass; X-ray fluorescence

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370275774455392

Affiliations: Materials Characterization Laboratory, Texas Instruments Incorporated, Dallas, Texas 75222

Publication date: January 1, 1975

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