Effect of Atomic Level Width on Ge(Li) X-ray Spectra

Authors: Pathak, B. P.1; Makherjee, S. K.2

Source: Applied Spectroscopy, Volume 28, Issue 5, Pages 413-487 (September/October 1974) , pp. 445-448(4)

Publisher: Society for Applied Spectroscopy

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Abstract:

The shapes of x-ray and γ-ray peaks have been studied with the use of a high resolution Ge(Li) spectrometer. The Kα x-ray peaks of high Z elements have been found to exhibit larger width compared to the width of γ-ray peaks of same energy. This excess width has been assigned to the natural energy width of characteristic x-ray lines. An analytical study of the variation of the observed width with the natural width of the incident radiation has been made. The computed results are in excellent agreement with the experimental observation.

Keywords: Atomic level width; Data treatment; Ge(Li) spectrometer; Radioactive source; X-ray spectroscopy

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370274774332137

Affiliations: 1: Department of Chemistry, Rensselaer Polytechnic Institute, Troy, New York 12181; on leave from Saha Institute of Nuclear Physics, Calcutta, India 2: Saha Institute of Nuclear Physics, Calcutta 700009, India

Publication date: September 1, 1974

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