A Polycrystalline Thin-Film Technique for Infrared Transmission Studies of Alkali Halogenates

$29.00 plus tax (Refund Policy)

Buy Article:

Abstract:

Polycrystalline thin films of alkali halogenates have been prepared by a solvent-evaporation technique. Refinement of the technique has enabled us to produce a uniform thin film free of the Christiansen effect. The film thicknesses have been measured by x-ray fluorescence to be from 0.4 to 1.0 μ, with an estimated error of less than 2%. The technique is based on the deposition of a thin film on a high-density polyethylene substrate making it possible to study quantitatively the external vibrational modes and those internal modes of potassium and sodium halogenates which have a resonant frequency of less than 600 cm−1

Keywords: Infrared; Thin films; Transmission

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370271779951020

Affiliations: Department of Chemistry and Hawaii Institute of Geophysics, University of Hawaii, Honolulu, Hawaii 96822

Publication date: November 1, 1971

More about this publication?
Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more