Modified Micro Sample Support for X-Ray Emission Spectrography
Abstract:When quantitatively analyzing small quantities of liquids or powders by x-ray fluorescence spectrometry, sample handling technique becomes extremely important in achieving repeatable results. The fluorescent intensity of the element being analyzed in the sample is dependent upon element concentration, matrix composition, placement in the primary beam, and the penetration depth of the primary beam. For the usual quantitative applications, the specimen thickness must be greater than the “critical” penetration depth of the primary beam for reliable results. Where the quantity of sample is sufficient, conventional sample cups work well. However, where less than 1 ml of liquid or 1 g of solid is available for analysis, the quantity necessary to satisfy the above requirement may not be met.
Document Type: Research Article
Affiliations: X-Ray Fluorescence Laboratory, Analytical Section, Research and Development, Sun Oil Company, Marcus Hook, Pennsylvania 19061
Publication date: May 1, 1971
More about this publication?
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
- Editorial Board
- Information for Authors
- Submit a Paper
- Subscribe to this Title
- Membership Information
- Request copyrighted SAS materials
- Spectroscopic Nomenclature
- Focal Point (Open Access)
- ingentaconnect is not responsible for the content or availability of external websites