When a dc arc is used for trace analysis on a spectrometer, calibration curves with a pronounced toe due to spectral background are found. For analysis of high purity materials it is most important that linear relationships should be established to ultra-trace levels when total impurity
content is specified within the ppm level. A solution to this problem is outlined and the linear relationships obtained for, copper, bismuth, and cadmium in high purity silver to 0.1 ppm are shown. An electronic circuit is described that enables these background corrections to be made.
Analytical and Electronic Materials Development Laboratories, Johnson Matthey Chemicals Limited, Orchard Road, Royston, Hertfordshire, England
Publication date: January 1, 1971
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)