Internal Reflection Spectroscopy in the Far-Infrared Region
Abstract:This note describes the extension of internal reflection spectroscopy into the far-infrared region below 150 cm−1. To the best of our knowledge this is the first reported use of internal reflection techniques below 250 cm−1, the cutoff point of the widely used KRS-5 reflector plate material.
Document Type: Research Article
Affiliations: Carnegie-Mellon University, Mellon Institute, Pittsburgh, Pennsylvania 15213
Publication date: July 1, 1969
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