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Use of a Calculation Method for X-Ray Emission Analysis

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Abstract:

The use of a fundamental parameter method for effecting matrix corrections in quantitative x-ray spectrochemical analysis is described. A versatile computer program calculates composition directly from measured intensities. Variations in the basic approach are employed in the analysis of a series of sulfide and oxide samples. The Applied Research Laboratories multi-channel x-ray quantometer (MXQ) is briefly described.

Keywords: Computer application; X-Ray analysis; X-Ray fluorescence

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370269774380635

Affiliations: International Nickel Co. of Canada Ltd., Sheridan Park, Clarkson, Ontario, Canada

Publication date: July 1, 1969

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