Precision Transducer for High Pressure Infrared Measurements

Authors: Fox, J.V.¹; Prengle, H.W.²

Source: Applied Spectroscopy, Volume 23, Issue 2, Pages 105-174 (March/April 1969) , pp. 157-159(3)

Publisher: Society for Applied Spectroscopy

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Abstract:

An externally mounted high pressure semiconductor strain gauge transducer of high precision is described which was used in connection with liquid ir absorption and PVT measurements up to 10 000 atm pressure. The transducer is nonlinear, but can be calibrated by a three point procedure, one point of which is the freezing point of mercury at 0°C, and fit to a derived mathematical function. The precision of the device is approximately 0.8 atm, with a repeatability of 5.5 parts in 10 000, at a level of 10 000 atm.

Document Type: Research article

DOI: http://dx.doi.org/10.1366/000370269774381030

Affiliations: 1: Department of Chemical & Petroleum Engineering, University of Houston, Houston, Texas 77004; present address: Southwest Research Institute, 8500 Culebra Road, San Antonio, Texas 78208 2: Department of Chemical & Petroleum Engineering, University of Houston, Houston, Texas 77004

Publication date: 1969-03-01

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