If you are experiencing problems downloading PDF or HTML fulltext, our helpdesk recommend clearing your browser cache and trying again. If you need help in clearing your cache, please click here . Still need help? Email help@ingentaconnect.com

Rotating Sample Holder for X-Ray Emission Spectrometry

$29.00 plus tax (Refund Policy)

Buy Article:

Abstract:

A rotating sample holder is invaluable in x-ray emission analysis of nonhomogeneous samples because when such samples are rotated, different sample areas are observed continuously, thus permitting an averaging of irregularities. This feature of the sample holder is of significance in the nondestructive testing of materials in that it provides more reliable analytical data. The rotating sample holder described in this paper is designed and constructed for use on a General Electric XRD6 x-ray emission spectrometer. The reduced x-ray intensity variation obtained by continuous sample rotation results in significant improvement in over-all precision compared with intensity variation obtained by rotation only between readings.

Document Type: Short Communication

DOI: http://dx.doi.org/10.1366/000370269774381184

Affiliations: General Electric Company, St. Petersburg, Florida 33733

Publication date: January 1, 1969

More about this publication?
Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more