Sample-Inlet System for Studying Adsorption of Low Vapor Pressure Materials on Solid Surfaces

Author: Kagel, R.O.

Source: Applied Spectroscopy, Volume 22, Issue 4, Pages 263-349 (July/August 1968) , pp. 343-344(2)

Publisher: Society for Applied Spectroscopy

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Abstract:

Infrared spectroscopy has not been extensively used to study vapor-phase adsorption of low volatility liquids or solids on solid surfaces. This is almost certainly because of the difficulties involved in introducing these samples into the cell in such a way that they can interact with an activated solid (catalytic) surface. In this type of application, it is necessary to devise a sample-inlet system which has a small volume, is operable at temperatures up to 200°C, is evacuable to 10⁻⁵ Torr, and will not interfere with the high temperature (500°C) oxidation (1 atm O₂) or high vacuum (10⁻⁵−10⁻⁶ Torr) pretreatment of the catalytic surface. That is to say, the inlet system must be an extension of the adsorption cell itself.

Document Type: Short communication

DOI: http://dx.doi.org/10.1366/000370268774383138

Affiliations: 1: Chemical Physics Research Laboratory, The Dow Chemical Company, Midland, Michigan 48640

Publication date: 1968-07-01

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