Low Temperature Far-Infrared Transmission Properties of Polycrystalline and Single-Crystal Silicon

Authors: Durig, J. R.; Bush, S. F.; Baglin, F. G.

Source: Applied Spectroscopy, Volume 22, Issue 3, Pages 153-213 (May/June 1968) , pp. 212-213(2)

Publisher: Society for Applied Spectroscopy

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Abstract:

Fateley et al. have reported that the far-infrared spectrum of polycrystalline silicon at room temperature has a 50% transmission curve from 30–500 cm−1 We wish to report the appearance of three bands in similar material upon cooling to liquid-nitrogen temperature. A standard low-temperature cell was used for the measurements. A Beckman model IR-11 spectrophotometer and a Perkin–Elmer 521 spectrophotometer were used to record our data.

Document Type: Short Communication

DOI: http://dx.doi.org/10.1366/000370268774383552

Affiliations: Department of Chemistry, University of South Carolina, Columbia, South Carolina 29208

Publication date: May 1, 1968

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