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Total-Burn Spectrographic Determination of Silicon in Plutonium

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Abstract:

A total-burn spectrographic method has been applied to the determination of trace concentrations of silicon in plutonium. The sample is oxidized to plutonium dioxide, mixed with a germanium dioxide–graphite mixture containing tin internal standard, packed into cupped graphite electrodes, and burned to completion in a high-amperage dc arc. Plutonium spectral interference is avoided by using the less sensitive Si 2506.90-Å line. The lower limit of the determination is 25 ppm of silicon in plutonium. The precision of the method is estimated to be ±8% (coefficient of variation) at the 270-ppm level and ±14% at 40 ppm.

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370267774385281

Affiliations: Battelle Memorial Institute, Pacific Northwest Laboratory, Richland, Washington 99352

Publication date: March 1, 1967

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