High-Sensitivity Attenuated Total-Reflection Spectroscopy

Author: Hirschfeld, Tomas

Source: Applied Spectroscopy, Volume 20, Issue 5, Pages 281-339 (September/October 1966) , pp. 336-338(3)

Publisher: Society for Applied Spectroscopy

Buy & download fulltext article:

OR

Price: $29.00 plus tax (Refund Policy)

Abstract:

Spectrophotometric analysis by attenuated total reflection was originally developed by Fahrenfort to utilize its low equivalent penetration of the light beam and, therefore, low sensitivity for the study of highly absorbent samples. Nearly simultaneously, Harrick proposed the method for the study of surfaces because of the low real penetration of the beam. Here sensitivity is at a premium, and in spite of the use of multiple-reflection techniques, it remained barely adequate for many cases. A considerable increase in the sensitivity of attenuated total-reflection spectroscopy (ATR) would not only resolve this problem but would make the technique useful in microanalysis because of the very low sample thickness required.

Document Type: Short communication

DOI: http://dx.doi.org/10.1366/000370266774385822

Affiliations: 1: Institute of Free Research, Faculty of Chemistry, Montivideo, Uruguay; present address: 2745 Darlington Place, Apt. 20, Montreal, Quebec

Publication date: 1966-09-01

More about this publication?
Related content

Tools

Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page