High-Sensitivity Attenuated Total-Reflection Spectroscopy
Author: Hirschfeld, Tomas
Source: Applied Spectroscopy, Volume 20, Issue 5, Pages 281-339 (September/October 1966) , pp. 336-338(3)
Publisher: Society for Applied Spectroscopy
Abstract:
Spectrophotometric analysis by attenuated total reflection was originally developed by Fahrenfort to utilize its low equivalent penetration of the light beam and, therefore, low sensitivity for the study of highly absorbent samples. Nearly simultaneously, Harrick proposed the method for the study of surfaces because of the low real penetration of the beam. Here sensitivity is at a premium, and in spite of the use of multiple-reflection techniques, it remained barely adequate for many cases. A considerable increase in the sensitivity of attenuated total-reflection spectroscopy (ATR) would not only resolve this problem but would make the technique useful in microanalysis because of the very low sample thickness required.Document Type: Short communication
DOI: http://dx.doi.org/10.1366/000370266774385822
Affiliations: 1: Institute of Free Research, Faculty of Chemistry, Montivideo, Uruguay; present address: 2745 Darlington Place, Apt. 20, Montreal, Quebec
Publication date: 1966-09-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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