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A multiple regression technique has been employed to calculate equations correlating x-ray fluorescent intensities with composition for complex sample matrices. The technique has been applied to a variety of materials containing major and minor components with a wide range of atomic
numbers. Equations for the concentration of elements as functions of the fluorescent intensities of the sample constituents are developed to calculate concentrations without the need for calibration curves. The equations themselves are programmed for computer calculation, permitting complete
computer determination of sample composition from measured intensities. In order to predict matrix effects, equations are also developed for the fluorescent intensities of elements as a function of the sample composition.
Union Carbide Corporation, Chemicals Division, Charleston, West Virginia
Publication date: May 1, 1966
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)