Direct Identification Of X-Ray Spectra

Author: Graeber, Edward J.

Source: Applied Spectroscopy, Volume 16, Issue 1, Pages 1-25 (January 1962) , pp. 24-24(1)

Publisher: Society for Applied Spectroscopy

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Abstract:

In the qualitative x-ray fluorescence analysis of materials, this laboratory is frequently confronted with the comparison and subsequent identification of numerous samples. Each such identification, whether by calculation or tables of wavelengths, is time-consuming. The use of a transparent overlay with appropriate scale factors has provided a valuable short cut.

Document Type: Research article

DOI: http://dx.doi.org/10.1366/000370262774416056

Affiliations: 1: Sandia Corporation, Sandia Base, Albuquerque, New Mexico

Publication date: 1962-01-01

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