Provider: ingentaconnect
Database: ingentaconnect
Content: application/x-research-info-systems
TY - ABST
AU - Holdt, G.
AU - Strasheim, A.
TI - The Use of Scatter Diagrams in Emission Spectroscopy
JO - Applied Spectroscopy
PY - 1960-06-01T00:00:00///
VL - 14
IS - 3
SP - 64
EP - 72
N2 - The necessity to employ two-dimensional statistical methods in emission spectroscopy and the dependence of variance of ΔY, i.e. of the logarithm of the intensity ratio of an analysis-internal standard line pair, on correlation and regression are pointed out. To investigate the
statistical behaviour of intensity ratios or the correlation of other quantities the scatter diagram method and its improvement by the contour ellipse are described. Examples of various applications are given and the calculation of the *"Complete Statistical Analysis"* is described. Finally
the completion of the scatter diagram method by statistical test methods is illustrated by examples.
UR - http://www.ingentaconnect.com/content/sas/sas/1960/00000014/00000003/art00002
M3 - doi:10.1366/000370260774614517
UR - http://dx.doi.org/10.1366/000370260774614517
ER -