Some Statistical Aspects of X-Ray Fluorescence Spectrometry

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Abstract:

A simple derivation of the probability distribution function for the time to accumulate a preset number of counts is outlined. The result is applied to X-ray fluorescence spectrometry in order to estimate the expected precision of the various measures of quantity of an element. Examples are given to show how the results may be used as a practical guide in this field of analytical chemistry.

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/000370255774633990

Affiliations: Knolls Atomic Power Laboratory, General Electric Company, Schenectady, New York

Publication date: November 1, 1955

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