Some Statistical Aspects of X-Ray Fluorescence Spectrometry

$29.00 plus tax (Refund Policy)

Buy Article:


A simple derivation of the probability distribution function for the time to accumulate a preset number of counts is outlined. The result is applied to X-ray fluorescence spectrometry in order to estimate the expected precision of the various measures of quantity of an element. Examples are given to show how the results may be used as a practical guide in this field of analytical chemistry.

Document Type: Research Article


Affiliations: Knolls Atomic Power Laboratory, General Electric Company, Schenectady, New York

Publication date: November 1, 1955

More about this publication?
Related content



Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more