Improved Industrial Infrared Spectrophotometers: The Manufacturer's Viewpoint

Author: Hare, George

Source: Applied Spectroscopy, Volume 7, Issue 3, Pages 109-144 (August 1953) , pp. 138-144(7)

Publisher: Society for Applied Spectroscopy

Buy & download fulltext article:

OR

Price: $29.00 plus tax (Refund Policy)

Abstract:

More than most people, the infrared instrument designer lives in a world of compromise. On the one hand he is asked for faster recording techniques—indeed, even instantaneous presentation—on the other hand he is asked for greater accuracy and precision and increased resolution. These requests are generally incompatible. If the accuracy of measurement is limited as it usually is by random fluctuations in the photoreceiver, then the only easy means by which higher accuracy can be won consists in taking a great deal more time for the measurement so that the random fluctuations may be averaged out. If increased resolution is desired, it too is generally won at sacrifice in scanning time.

Document Type: Research article

DOI: http://dx.doi.org/10.1366/000370253774634784

Affiliations: 1: Research Department, Beckman Instruments, Inc., 820 Mission Street, South Pasadena, California

Publication date: 1953-08-01

More about this publication?
Related content

Tools

Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page