Improved Industrial Infrared Spectrophotometers: The Manufacturer's Viewpoint
Author: Hare, George
Source: Applied Spectroscopy, Volume 7, Issue 3, Pages 109-144 (August 1953) , pp. 138-144(7)
Publisher: Society for Applied Spectroscopy
Abstract:
More than most people, the infrared instrument designer lives in a world of compromise. On the one hand he is asked for faster recording techniques—indeed, even instantaneous presentation—on the other hand he is asked for greater accuracy and precision and increased resolution. These requests are generally incompatible. If the accuracy of measurement is limited as it usually is by random fluctuations in the photoreceiver, then the only easy means by which higher accuracy can be won consists in taking a great deal more time for the measurement so that the random fluctuations may be averaged out. If increased resolution is desired, it too is generally won at sacrifice in scanning time.Document Type: Research article
DOI: http://dx.doi.org/10.1366/000370253774634784
Affiliations: 1: Research Department, Beckman Instruments, Inc., 820 Mission Street, South Pasadena, California
Publication date: 1953-08-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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