Predicted Genetic Gains from one Generation of Slash Pine Tree Improvement
Gains over unimproved seed for progeny from first generation--un-rogued, first generation--rogued, and one and one-half generation orchards of slash pine (Pinus elliottii var. elliottii) for individual tree volume at 15 years are predicted to be 10%, 15%, and 19%, respectively. Rust infection of orchard progeny on sites where unimproved material incurs 50% infection are predicted to be 49%, 41%, and 35% for the three orchard types. Using a growth and yield model that incorporates fusiform rust, gains in individual tree volume and increased rust resistance were combined to estimate effects on per acre yields. Percent volume per acre gains are predicted to be 7.0%, 13.2%, and 18.0% for the three orchard types. Collection and deployment of the most rust resistant seed to high rust hazard sites raises the gain on these sites and becomes increasingly beneficial as the rust hazard increases. South. J. Appl. For. 13(1): 51-56.
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Document Type: Journal Article
Affiliations: Department of Forestry, University of Florida, Gainesville, FL 32611
Publication date: 1989-02-01
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