Applied Economics Letters

How does a 48-hour test-taking window affect performance? Results from a testing centre
pp. 495-498(4)
Authors: Hilmer, Christiana; Hilmer, Michael

The transmission of import prices to domestic prices: an application to Indonesia
pp. 499-503(5)
Author: Warr, Peter

Does the linkage between stock market performance and economic growth vary across Greater China?
pp. 505-508(4)
Authors: Liu, Xiaohui; Sinclair, Peter

Power comparison of invariant unit root tests
pp. 509-512(4)
Author: Vougas, Dimitrios

TIPS and inflation expectations
pp. 513-517(5)
Authors: Bardong, Florian; Lehnert, Thorsten

The causal relationships between foreign exchange intervention and exchange rate
pp. 519-522(4)
Author: Hoshikawa, Takeshi

High-technology exports and economic output: an empirical investigation
pp. 523-525(3)
Author: Yoo, Seung-Hoo

Interaction between formal and informal sector credit: new evidence from India
pp. 527-531(5)
Author: Bhaumik, Sumon Kumar

Estimating portfolio value-at-risk via dynamic conditional correlation MGARCH model - an empirical study on foreign exchange rates
pp. 533-538(6)
Authors: Hsu Ku, Yuan-Hung; Wang, Jai Jen

The (UN-) stable relationship between the exchange rate and its fundamentals
pp. 539-544(6)
Author: Altavilla, Carlo

Empirical analysis of political uncertainty on TAIEX stock market
pp. 545-550(6)
Authors: Wang, Yi-Hsien; Lin, Chin-Tsai

Do CO2 emission levels converge among 21 OECD countries? New evidence from unit root structural break tests
pp. 551-556(6)
Authors: Lee, Chien-Chiang; Chang, Chun-Ping; Chen, Pei-Fen

Technology- and investment-led growth effects of economic integration: a panel cointegration analysis for the EU-15 (1960-2000)
pp. 557-561(5)
Author: Badinger, Harald

Inequality and the growth-poverty nexus: specification empirics using African data
pp. 563-566(4)
Author: Fosu, Augustin Kwasi

A variance ratio test of the behaviour of Chinese stock indices
pp. 567-571(5)
Authors: Zhang, Bing; Xindan, Li

Herding behaviour in Spanish equity funds
pp. 573-576(4)
Authors: Agudo, Luis Ferruz; Sarto, J. L.; Vicente, L.