Skip to main content

X-ray photoelectron spectroscopic study of layer charge magnitude in micas and illite-smectite clays

Buy Article:

$13.61 plus tax (Refund Policy)

Abstract:

X-ray photoelectron spectroscopy (XPS) was used to determine the surface-charge magnitude and distribution for some micas and high-illite I-S clays. Based on predictable layer by layer atomic ratios for margarite, muscovite and sericite it was possible to establish an escape depth of ~15 Åfor photoelectrons. After the replacement of surface ions by Ba2+, interlayer ion (Ca, K, Na)/Ba ratios are a measure of the relative layer charges on external surfaces and the first internal interlayer. These ratios can be used to assign charge magnitudes and ascertain layer charge asymmetry when it occurs. The O/Ba ratios determined by XPS serve the same purpose. Diagenetic I-S from the Vienna Basin gives an XPS-determined symmetrical layer charge of 0.41; in a similar clay from the Gulf Coast sequence, the outer surface is smectitic, with an external charge of 0.21, in contrast to an opposing silica layer with a charge of 0.31.

Keywords: CLAY MINERALS; ILLITE; MICAS; SURFACE CHARGE; X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)

Document Type: Research Article

DOI: https://doi.org/10.1180/000985501750539454

Publication date: 2001-09-01

More about this publication?
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
UA-1313315-23
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more