Authors: Abebe, H.; Tyree, V.; Morris, H.; Vernier, P.T.

Source: International Journal of Electrical Engineering Education, Volume 44, Number 3, September 2007 , pp. 249-262(14)

Publisher: Manchester University Press

Abstract:

This tutorial paper discusses the SPICE BSIM3v3.1 model parameter extraction and optimisation strategies that show consistency and very good accuracy in circuit simulation, less than 10% error, for practical IC design application in deep submicron processes. This paper describes an approach to BSIM3v3.1 model parameter extraction that mitigates or eliminates many of the unstable circuit behaviours observed during SPICE simulations with BSIM3v3. We present here a strategy applicable to 0.18 micron CMOS technology, in which the accuracy of the final extracted model parameters is evaluated by comparing simulations of inverter gain and a 31-stage ring oscillator with measured data.

Keywords: ELECTRICAL ENGINEERING EDUCATION; MOSFET; PARAMETER EXTRACTION; SPICE

Document Type: Research article

Publication date: 2007-09-01

More about this publication?

• IJEEE is a forum for the exchange of ideas in the teaching of electrical engineering and electronics at university and technical college level. It highlights the use of communication and information technology including the World Wide Web, curriculum design and validation, assessment, and distance learning, as well as presenting new topics and reports of laboratory experiments.
  
  Current scope
  The journal (96 pp., quarterly) features articles and book reviews which highlight aspects of the teaching of current topics in electrical and electronic engineering. Within an engineering educational context, these can range from specific projects, case studies and reports of laboratory practice to broader developments such as new teaching methods, curriculum design, assessment, validation and the impact of new technologies.
  
  All papers are peer-reviewed. The journal includes high-quality black-and-white illustrations and has been published for the past 30 years by Manchester University Press, recently in both print and on-line formats. The journal editors are based in the School of Electrical and Electronic Engineering at The University of Manchester (formerly the Department of Electrical Engineering and Electronics at the University of Manchester Institute of Science and Technology [UMIST]).

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