Evaluation and application of a fast EBSD detector

Authors: I. Brough, F. J. Humphreys

Source: Materials Science and Technology

Publisher: Maney Publishing

Abstract:

A Nordlys F, fast electron backscatter diffraction camera has been used on a CamScan MX2500 field emission gun SEM in conjunction with a hot stage to study annealing phenomena in metals. The performance of the camera under a wide variety of conditions has been evaluated, and comparison is made with a conventional electron backscatter diffraction camera operating under the same conditions and with the same samples. Examples are given of applications of the system to the annealing of aluminium alloys.

Document Type:

DOI: 10.1179/026708309X12468927349415

The full text article is not available for purchase.

The publisher only permits individual articles to be downloaded by subscribers.

Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages.
Shopping cart
Tools
Sign in






Need to register?
Sign up here
Key:
Free Content - Free Content
New Content - New Content
Subscribed Content - Subscribed Content
Free Trial Content - Free Trial Content
Text size: A | A | A | A