Microscopic and macroscopic investigation of electrical contacts to n type and p type ZnSe
Authors: Dharmadasa, I. M.; Blomfield, C. J.; Coratger, R.; Ajustron, E.; Beauvillain, J.; Simpson, J.; Prior, K. A.; Cavenett, B. C.
Source: Materials Science and Technology, Volume 12, Number 1, January 1996 , pp. 86-89(4)
Publisher: Maney Publishing
Abstract:
Surface preparation methods were established using wet chemical etching of ZnSe epilayers and the stoichiometry of the resulting surfaces was studied using X-ray photoelectron spectroscopy. It is found that the stoichiometry of the surface is very sensitive to the chemical treatment and surfaces can be produced that are rich in either Se or Zn. Electrical contacts were fabricated by vacuum evaporation of Ag, Sb, or Au on to nearly stoichiometric surfaces. Electrical properties were studied using the current–voltage technique and it has been found that the Schottky barrier heights measured vary from contact to contact, although the processing and metal used are identical. Discrete barrier heights of 1·67, 1·48, 1·20, and 0·90 eV are observed for metal/n-ZnSe contacts using the three metals studied. The first two barrier heights, 1·67 and 1·48 eV, are identical to those reported in the literature. Aging effects of current–voltage characteristics were also monitored and it was observed that the barrier height varies with time, showing one of the four values mentioned above. Ballistic electron emission microscopy carried out on 1·67 eV barrier contacts confirms the accuracy of the current-voltage barrier height determinations. Electrical properties of metal/p-ZnSe contacts are also presented and their aging effects discussed.MST/3314
Document Type: Research Article
Publication date: 1996-01-01
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Materials Science and Technology is the successor of two previous titles, for which digitised archives are available: Metal Science (Vols. 1—17; 1967—84) and Metals Technology (Vols. 1—11; 1974—84).
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- By this author: Dharmadasa, I. M. ; Blomfield, C. J. ; Coratger, R. ; Ajustron, E. ; Beauvillain, J. ; Simpson, J. ; Prior, K. A. ; Cavenett, B. C.

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