Dual phase vitreous enamels Part 3 Transmission electron microscopy of enamel/ substrate interface

Authors: Nisbet, W. J.; Lorimer, G. W.; Sherhod, C.; Stowell, M. J.

Source: Materials Science and Technology, Volume 6, Number 2, February 1990 , pp. 182-186(5)

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Abstract:

A transmission electron microscopy investigation has been carried out of the ion beam milled cross-section of a dual phase vitreous enamel. The investigation has revealed protrusions of α-Fe which grow into the glass from the substrate, similar to those reported in previous work. A new observation is the presence of a high density of small (˜0·1 μm dia.) iron rich, intermetallic particles in the enamel close to the interface with the steel. It is proposed that these particles play an important role in toughening the enamel in this region and hence improving the strength of the enamel–substrate bond.

MST/1143

Document Type: Research Article

DOI: http://dx.doi.org/10.1179/026708390790191242

Publication date: 1990-02-01

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