Dual phase vitreous enamels Part 3 Transmission electron microscopy of enamel/ substrate interface
Authors: Nisbet, W. J.; Lorimer, G. W.; Sherhod, C.; Stowell, M. J.
Source: Materials Science and Technology, Volume 6, Number 2, February 1990 , pp. 182-186(5)
Publisher: Maney Publishing
Abstract:A transmission electron microscopy investigation has been carried out of the ion beam milled cross-section of a dual phase vitreous enamel. The investigation has revealed protrusions of α-Fe which grow into the glass from the substrate, similar to those reported in previous work. A new observation is the presence of a high density of small (˜0·1 μm dia.) iron rich, intermetallic particles in the enamel close to the interface with the steel. It is proposed that these particles play an important role in toughening the enamel in this region and hence improving the strength of the enamel–substrate bond.
Document Type: Research Article
Publication date: 1990-02-01
Authors wishing to cite fast track papers should give the journal name and the article DOI. This will enable reference linking via CrossRef and allow forward and backward citation tracking systems to associate the fast track citation with the final journal reference.Materials Science and Technology is the successor of two previous titles, for which digitised archives are available: Metal Science (Vols. 1—17; 1967—84) and Metals Technology (Vols. 1—11; 1974—84).
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