Images formed by laser metrology of complex substructures: new concept in non-destructive inspection
Authors: Webster, J M; Markov, V
Source: Imaging Science Journal, The, Volume 55, Number 4, December 2007 , pp. 242-249(8)
Publisher: Maney Publishing
Abstract:
The present paper presents the results of the remote recording, analysis and study of defect detection with laser Doppler vibrometry (LDV) coupled with shockwave excitation. The non-destructive inspection (NDI) procedure employed is based on the vibrational excitation and evaluation of test objects with defects of both known and unknown parameters. Additionally the potential advantages are presented of using whole field laser Doppler vibrometry (WFLDV) being developed. To evaluate the procedure the technique has been applied to a number of different samples that have been tested by this system of NDI. The test samples included multilayer and sandwich composites, ceramic and aluminium structures containing in service occurring or preprogrammed defects. Additionally included is an example of corrosion occurring at second and third layers in an airframe structure together with an example, manufactured to simulate metal loss, by introducing a 'defect' represented by a machined thickness removal of 2% at the central part of the test object.Keywords: ACOUSTIC IMAGING; NDI; LASER ANIMOMETRY; LASER ANEMOMETRY
Document Type: Research Article
DOI: http://dx.doi.org/10.1179/174313107X214277
Publication date: 2007-12-01
- Maney's Journal of the Month for May is The Imaging Science Journal. For this month only, we're giving away FREE access to a range of peer-reviewed and international articles from the journal. Visit the Journal of the Month page and sign up to access all of this FREE CONTENT! Meet the editors, discover special issues, view fantastic imagery and benefit from large discounts on subscriptions prices throughout May. Enjoy!
- Editorial Board
- Information for Authors
- Subscribe to this Title
- Membership Information
- Terms & Conditions
- ingentaconnect is not responsible for the content or availability of external websites
- In this: publication
- By this: publisher
- In this Subject: Technology
- By this author: Webster, J M ; Markov, V

Shopping cart
Receive new issue alert
Get Permissions