Preliminary studies using imaging mass spectrometry TOF-SIMS in detection and analysis of fingerprints

Authors: Szynkowska, M I; Czerski, K; Grams, J; Paryjczak, T; Parczewski, A

Source: Imaging Science Journal, The, Volume 55, Number 3, September 2007 , pp. 180-187(8)

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Abstract:

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is applied for the characterization and detection of fingerprints. In this case the possibility of surface imaging in various ions appears to be very interesting and useful. Experimental work was carried out using six types of surface (stainless steel, copper, brass, aluminium foil, glass, paper) on which fingerprints were placed. 'Natural' fingerprints and fingerprints polluted with Ni(NO₃)₂·6H₂O, gunpowder residues and As₂O₃. were examined. The results suggest the possibility of relating the TOF-SIMS fingerprints to other evidence found at the crime scene, e.g. chemicals, beverages or gun shot residues discovered on the fingerprints.

Keywords: FINGERPRINTS; TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS); IMAGES

Document Type: Research Article

DOI: http://dx.doi.org/10.1179/174313107X177657

Publication date: 2007-09-01

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