Parts screening for ESD susceptibility

Authors: Gorlov, M.¹; Emel’yanov, V.²; Rubtsevich, I.²; Smirnov, D.¹

Source: Russian Microelectronics, Volume 34, Number 1, January 2005 , pp. 22-29(8)

Publisher: MAIK Nauka/Interperiodica

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Abstract:

An approach to screening of ICs and discrete transistors for ESD susceptibility is discussed. Procedures are proposed for comparing transistor batches in terms of reliability and for identifying items of unusual reliability among conforming ones in an IC batch, using annealing of ESD-induced faults.

Document Type: Research article

DOI: http://dx.doi.org/10.1007/s11180-005-0003-x

Affiliations: 1: Voronezh State Technical University, Voronezh, Russia, 2: NPO Integral, Russia,

Publication date: 2005-01-01