Dependence of the spectral resolution of an X-ray diffractor on the shape and curvature of the reflecting surface

Authors: Latush, E.; Mazuritsky, M.¹

Source: Technical Physics Letters, Volume 28, Number 1, January 2002 , pp. 21-22(2)

Publisher: MAIK Nauka/Interperiodica

Abstract:

Dependence of the spectral resolution of a focusing X-ray diffractor on the shape of the reflecting crystallographic planes was theoretically studied in the point source approximation. An analytical expression describing the resolution as a function of the crystal curvature in the focusing circle plane was derived. An optimum radius of the curvature ensuring the best spectral resolution was determined for a nonsymmetric diffractor scheme.

Document Type: Research article

DOI: 10.1134/1.1448631

Affiliations: 1: Email: mazurmik@icomm.ru

Links for this article

http://www.ingentaconnect.com/maik/10637850/2002/00000028/00000001/00000929
http://openurl.ingenta.com/content?genre=article&issn=1063-7850&volume=28&issue=1&spage=21&epage=22
http://dx.doi.org/10.1134/1.1448631