Dependence of the spectral resolution of an X-ray diffractor on the shape and curvature of the reflecting surface

Authors: Latush, E.; Mazuritsky, M.1

Source: Technical Physics Letters, Volume 28, Number 1, January 2002 , pp. 21-22(2)

Publisher: MAIK Nauka/Interperiodica

Key:
Free Content - Free Content
New Content - New Content
Subscribed Content - Subscribed Content
Free Trial Content - Free Trial Content

Abstract:

Dependence of the spectral resolution of a focusing X-ray diffractor on the shape of the reflecting crystallographic planes was theoretically studied in the point source approximation. An analytical expression describing the resolution as a function of the crystal curvature in the focusing circle plane was derived. An optimum radius of the curvature ensuring the best spectral resolution was determined for a nonsymmetric diffractor scheme.

Document Type: Research article

DOI: 10.1134/1.1448631

Affiliations: 1: Email: mazurmik@icomm.ru

The full text electronic article is available for purchase. You will be able to download the full text electronic article after payment.

$45.00 plus tax      Refund Policy

 

OR

Back to top

Key:
Free Content - Free Content
New Content - New Content
Subscribed Content - Subscribed Content
Free Trial Content - Free Trial Content
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages.
Page Help Click here for Page Help
Shopping cart
Tools
Sign in






Need to register?
Sign up here
Text size: A | A | A | A