Diagnostics of an H− ion beam by light emission from the drift chamber
Authors: Artemov, A.; Astrakharchik, G.; Baigachev, Yu.; Gevorkov, A.
Source: Technical Physics, Volume 45, Number 1, January 2000 , pp. 116-120(5)
Publisher: MAIK Nauka/Interperiodica
Abstract:The possibility of diagnosing an ion beam by light emission from the drift chamber is demonstrated using a 2-MeV H− ion beam as an example. For a local gas puffing and negligible beam losses, spatial characteristics of the beam and the time behavior of the current pulse were monitored and the falling of a small number of ions onto the vacuum-chamber wall was recorded. A profilometer for recording the emission from individual layers of the observed region is described.
Document Type: Research Article
Publication date: January 1, 2000