Diagnostics of an H ion beam by light emission from the drift chamber

Authors: Artemov, A.; Astrakharchik, G.; Baigachev, Yu.; Gevorkov, A.

Source: Technical Physics, Volume 45, Number 1, January 2000 , pp. 116-120(5)

Publisher: MAIK Nauka/Interperiodica

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Abstract:

The possibility of diagnosing an ion beam by light emission from the drift chamber is demonstrated using a 2-MeV H ion beam as an example. For a local gas puffing and negligible beam losses, spatial characteristics of the beam and the time behavior of the current pulse were monitored and the falling of a small number of ions onto the vacuum-chamber wall was recorded. A profilometer for recording the emission from individual layers of the observed region is described.

Document Type: Research Article

DOI: http://dx.doi.org/10.1134/1.1259581

Publication date: January 1, 2000

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