Springer logo

Publisher: Springer

Related content
Volume 66, Number 3, February 2006

< previous issue | all issues | next issue >

Law of cumulative advantages in the evolution of scientific fields
pp. 441-449(9)
Authors: Cahlík, Tomáš; Jiřina, Marcel

Publications resulting from Spanish radiology meeting abstracts: Which, Where and Who
pp. 467-480(14)
Authors: Miguel-Dasit, A.; Martí-Bonmatí, L.; Aleixandre, R.; Sanfeliu, P.; Valderrama, J. C.

Issues in measuring the degree of technological specialisation with patent data
pp. 481-492(12)
Authors: van Zeebroeck, Nicolas; van Pottelsberghe de la Potterie, Bruno; Han, Wook

Assessing the foreign control of production of technology: The case of a small open economy
pp. 493-512(20)
Authors: Cincera, Michele; van Pottelsberghe de la Potterie, Bruno; Reinhilde, Veugelers

Scientific evaluations of citation quality of international research articles in the SCI database: Thailand case study
pp. 521-535(15)
Authors: Sombatsompop, Narongrit; Kositchaiyong, Apisit; Markpin, Teerasak; Inrit, Sekson

Proof of a conjecture of Moed and Garfield on authoritative references and extension to non-authoritative references
pp. 537-549(13)
Authors: Egghe, Leo; Ravichandra Rao, I. K.; Bhusan Sahoo, Bibhuti

Towards a European economics of economics: Monitoring a decade of top research and providing some explanation
pp. 579-612(34)
Authors: Süssmuth, Bernd; Steininger, Martin; Ghio, Stephane

Another ISI idiosyncrasy
pp. 613-614(2)
Authors: Jin, Bihui; Rousseau, Ronald

Letter to the Editor
pp. 615-617(3)
Authors: Kalyane, V. L.; Kumar, Vijai; Mohan, Lalit; Kademani, B. S.

Index
pp. 619-626(8)

< previous issue | all issues | next issue >

Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page