Reply to the comments of Liu et al.

Author: van Raan, Anthony F. J.

Source: Scientometrics, Volume 64, Number 1, July 2005 , pp. 111-112(2)

Publisher: Springer

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Document Type: Research article

DOI: http://dx.doi.org/10.1007/s11192-005-0242-y

Affiliations: 1: Centre for Science and Technology Studies, Leiden University, P.O. Box 9555, 2300 RB Leiden, The Netherlands,

Publication date: 2005-07-01

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