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Publisher: Springer

Volume 63, Number 2, April 2005
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Bibliometric laws: Empirical flaws of fit
pp. 209-229(21)
Authors: Bailón-Moreno, R.; Jurado-Alameda, E.; Ruiz-Baños, R.; Courtial, J. P.

The unified scientometric model. Fractality and transfractality
pp. 231-257(27)
Authors: Bailón-Moreno, R.; Jurado-Alameda, E.; Ruiz-Baños, R.; Courtial, J. P.

Analysis of the field of physical chemistry of surfactants with the Unified Scienctometric Model. Fit of relational and activity indicators
pp. 259-276(18)
Authors: Bailón-Moreno, R.; Jurado-Alameda, E.; Ruiz-Baños, R.; Courtial, J. P.

Korean science and international collaboration, 1995-2000
pp. 321-339(19)
Author: Kim, Mee-Jean

What's in a title? Numbers of words and the presence of colons
pp. 341-356(16)
Authors: Lewison, Grant; Hartley, James

Relativity of citation performance and excellence measures: From cross-field to cross-scale effects of field-normalisation
pp. 373-401(29)
Authors: Zitt, Michel; Ramanana-Rahary, Suzy; Bassecoulard, Elise

Nota bene: Reviewing some OECD's R&D definitions
pp. 403-405(3)
Author: De Marchi, Mario

Walk-round
pp. 407-419(13)
Authors: Leydesdorff, Loet; Trimnle, Virginia; Vinkler, Péter

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